Research on EDAC Schemes for Memory in Space Applications

Research on EDAC Schemes for Memory in Space Applications

Memory used for storing the configuration bitstream of field programmable gate array in space applications often encounters single event upset problems, which may disrupt the integrity of data in memory and lead to unpredictable failures. For commercial memories used in low Earth orbit (LEO), single...

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Bibliographic Details
Main Authors: Mengfu Chen, Chenguang Guo, Lei Chen, Wenjie Li, Fan Zhang, Xiaoxiang Hu, Jiancheng Xu
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Electronics
Subjects:
EDAC
memory
Bose–Chaudhuri–Hocquenghem
cyclic redundancy check
single event upset
field programmable gate array
Online Access:https://www.mdpi.com/2079-9292/10/5/533

Internet

https://www.mdpi.com/2079-9292/10/5/533

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