Low-Coherence Interferometry for Measurement of Properties of Optical Components
We present a modification of the interferometric method for the measurement of refractive index or thickness of optical devices using an easily aligned, almost all-fiber Michelson interferometer. Applicability of the method is demonstrated by the chromatic dispersion measurement of photonic crystal...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Žilina
2010-06-01
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| Series: | Communications |
| Subjects: | |
| Online Access: | https://komunikacie.uniza.sk/artkey/csl-201002-0003_low-coherence-interferometry-for-measurement-of-properties-of-optical-components.php |