Low-Coherence Interferometry for Measurement of Properties of Optical Components
We present a modification of the interferometric method for the measurement of refractive index or thickness of optical devices using an easily aligned, almost all-fiber Michelson interferometer. Applicability of the method is demonstrated by the chromatic dispersion measurement of photonic crystal...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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University of Žilina
2010-06-01
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| Series: | Communications |
| Subjects: | |
| Online Access: | https://komunikacie.uniza.sk/artkey/csl-201002-0003_low-coherence-interferometry-for-measurement-of-properties-of-optical-components.php |
| _version_ | 1797847061495808000 |
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| author | Daniel Kacik Norbert Tarjanyi Ivan Turek |
| author_facet | Daniel Kacik Norbert Tarjanyi Ivan Turek |
| author_sort | Daniel Kacik |
| collection | DOAJ |
| description | We present a modification of the interferometric method for the measurement of refractive index or thickness of optical devices using an easily aligned, almost all-fiber Michelson interferometer. Applicability of the method is demonstrated by the chromatic dispersion measurement of photonic crystal fiber sample. The birefringence of the optical device based on LiNbO3 obtained from the measurement of refractive indices is demonstrated and its value is determined for two different crystal samples. It is also shown that when the thickness of, for example, photopolymer material is known the refractive index of the device can be determined. The described method can be a practical tool for laboratories with the need of inexpensive and easily built setup for measurement of refractive index or thickness of optical devices even in a broad spectral range. |
| first_indexed | 2024-04-09T18:04:31Z |
| format | Article |
| id | doaj.art-e71635cd6558445784d8e9468ffa46af |
| institution | Directory Open Access Journal |
| issn | 1335-4205 2585-7878 |
| language | English |
| last_indexed | 2024-04-09T18:04:31Z |
| publishDate | 2010-06-01 |
| publisher | University of Žilina |
| record_format | Article |
| series | Communications |
| spelling | doaj.art-e71635cd6558445784d8e9468ffa46af2023-04-14T06:30:17ZengUniversity of ŽilinaCommunications1335-42052585-78782010-06-01122141810.26552/com.C.2010.2.14-18csl-201002-0003Low-Coherence Interferometry for Measurement of Properties of Optical ComponentsDaniel Kacik0Norbert Tarjanyi1Ivan Turek2Department of Physics, Faculty of Electrical Engineering, University of Zilina, SlovakiaDepartment of Physics, Faculty of Electrical Engineering, University of Zilina, SlovakiaDepartment of Physics, Faculty of Electrical Engineering, University of Zilina, SlovakiaWe present a modification of the interferometric method for the measurement of refractive index or thickness of optical devices using an easily aligned, almost all-fiber Michelson interferometer. Applicability of the method is demonstrated by the chromatic dispersion measurement of photonic crystal fiber sample. The birefringence of the optical device based on LiNbO3 obtained from the measurement of refractive indices is demonstrated and its value is determined for two different crystal samples. It is also shown that when the thickness of, for example, photopolymer material is known the refractive index of the device can be determined. The described method can be a practical tool for laboratories with the need of inexpensive and easily built setup for measurement of refractive index or thickness of optical devices even in a broad spectral range.https://komunikacie.uniza.sk/artkey/csl-201002-0003_low-coherence-interferometry-for-measurement-of-properties-of-optical-components.phpno keywords |
| spellingShingle | Daniel Kacik Norbert Tarjanyi Ivan Turek Low-Coherence Interferometry for Measurement of Properties of Optical Components Communications no keywords |
| title | Low-Coherence Interferometry for Measurement of Properties of Optical Components |
| title_full | Low-Coherence Interferometry for Measurement of Properties of Optical Components |
| title_fullStr | Low-Coherence Interferometry for Measurement of Properties of Optical Components |
| title_full_unstemmed | Low-Coherence Interferometry for Measurement of Properties of Optical Components |
| title_short | Low-Coherence Interferometry for Measurement of Properties of Optical Components |
| title_sort | low coherence interferometry for measurement of properties of optical components |
| topic | no keywords |
| url | https://komunikacie.uniza.sk/artkey/csl-201002-0003_low-coherence-interferometry-for-measurement-of-properties-of-optical-components.php |
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