Electrical spectroscopy of defect states and their hybridization in monolayer MoS2

Electrical spectroscopy of defect states and their hybridization in monolayer MoS2

Deep level transient spectroscopy (DLTS) is an established characterization technique used to study electrically active defects in 3D semiconductors. Here, the authors show that DLTS can also be applied to monolayer semiconductors, enabling in-situ characterization of the energy states of different...

Full description

Bibliographic Details
Main Authors: Yanfei Zhao, Mukesh Tripathi, Kristiāns Čerņevičs, Ahmet Avsar, Hyun Goo Ji, Juan Francisco Gonzalez Marin, Cheol-Yeon Cheon, Zhenyu Wang, Oleg V. Yazyev, Andras Kis
Format: Article
Language:English
Published: Nature Portfolio 2023-01-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-022-35651-1

Internet

https://doi.org/10.1038/s41467-022-35651-1

Similar Items