Electrical spectroscopy of defect states and their hybridization in monolayer MoS2
Deep level transient spectroscopy (DLTS) is an established characterization technique used to study electrically active defects in 3D semiconductors. Here, the authors show that DLTS can also be applied to monolayer semiconductors, enabling in-situ characterization of the energy states of different...
| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2023-01-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-022-35651-1 |