Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2019-01-01
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| Series: | ITM Web of Conferences |
| Online Access: | https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf |