Tip-Jump Response of an Amplitude-Modulated Atomic Force Microscope
The dynamic behaviors of an Atomic Force Microscope are of interest, and variously unpredictable phenomena are experimentally measured. In practical measurements, researchers have proposed many methods for avoiding these uncertainties. However, causes of these phenomena are still hard to demonstrate...
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| Format: | Article |
| Language: | English |
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MDPI AG
2012-05-01
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| Series: | Sensors |
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| Online Access: | http://www.mdpi.com/1424-8220/12/5/6666 |