Single-exposure X-ray phase imaging microscopy with a grating interferometer

Single-exposure X-ray phase imaging microscopy with a grating interferometer

The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is at...

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Bibliographic Details
Main Authors: Andreas Wolf, Bernhard Akstaller, Silvia Cipiccia, Silja Flenner, Johannes Hagemann, Veronika Ludwig, Pascal Meyer, Andreas Schropp, Max Schuster, Maria Seifert, Mareike Weule, Thilo Michel, Gisela Anton, Stefan Funk
Format: Article
Language:English
Published: International Union of Crystallography 2022-05-01
Series:Journal of Synchrotron Radiation
Subjects:
phase contrast x-ray imaging
x-ray microscopy
grating interferometry
phase retrieval
Online Access:http://scripts.iucr.org/cgi-bin/paper?S160057752200193X

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http://scripts.iucr.org/cgi-bin/paper?S160057752200193X

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