Research on reliability evolutionary optimization of relays device based on Multi-Markov model

Research on reliability evolutionary optimization of relays device based on Multi-Markov model

Article highlights A Markov model of multi-modal hierarchical spatial states is created. The analytical expression of comprehensive availability for the reliability index of the prediction device is derived. The CPU module failure rate threshold for intelligent production testing is amended. A theor...

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Bibliographic Details
Main Authors: Xiang Wang, JianFeng Zhao, GaoLei Wang, TianShuo Wang
Format: Article
Language:English
Published: Springer 2023-02-01
Series:SN Applied Sciences
Subjects:
Evolutionary optimization
Intelligent test
Modules
Multi modal Markov
Relays device
Reliability
Online Access:https://doi.org/10.1007/s42452-023-05309-8

Internet

https://doi.org/10.1007/s42452-023-05309-8

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