Electronic properties of the passive films formed on CoCrFeNi and CoCrFeNiAl high entropy alloys in sodium chloride solution

In the present work, the electronic properties of the passive films formed on equiatomic CoCrFeNi and CoCrFeNiAl high-entropy alloys were investigated in sodium chloride solution. The point defect model (PDM) was employed to study the effect of aluminum addition on the transport of p-type or n-type...

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Xehetasun bibliografikoak
Egile Nagusiak: Camila Boldrini Nascimento, Uyime Donatus, Carlos Triveño Ríos, Renato Altobelli Antunes
Formatua: Artikulua
Hizkuntza:English
Argitaratua: Elsevier 2020-11-01
Saila:Journal of Materials Research and Technology
Gaiak:
Sarrera elektronikoa:http://www.sciencedirect.com/science/article/pii/S2238785420318615