A Defect-Inspection System Constructed by Applying Autoencoder with Clustered Latent Vectors and Multi-Thresholding Classification
Defect inspection is an important issue in the field of industrial automation. In general, defect-inspection methods can be categorized into supervised and unsupervised methods. When supervised learning is applied to defect inspection, the large variation of defect patterns can make the data coverag...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-02-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/12/4/1883 |