Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)]
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2022-05-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/5.0070460 |