Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)]
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2022-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0070460 |
| _version_ | 1817975628646842368 |
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| author | Zhao Guan Zhen-Zheng Jiang Bo-Bo Tian Yi-Ping Zhu Ping-Hua Xiang Ni Zhong Chun-Gang Duan Jun-Hao Chu |
| author_facet | Zhao Guan Zhen-Zheng Jiang Bo-Bo Tian Yi-Ping Zhu Ping-Hua Xiang Ni Zhong Chun-Gang Duan Jun-Hao Chu |
| author_sort | Zhao Guan |
| collection | DOAJ |
| first_indexed | 2024-04-13T21:52:22Z |
| format | Article |
| id | doaj.art-e9e2b7f5f98c431a9e87869a425bdccf |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-04-13T21:52:22Z |
| publishDate | 2022-05-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-e9e2b7f5f98c431a9e87869a425bdccf2022-12-22T02:28:23ZengAIP Publishing LLCAIP Advances2158-32262022-05-01125059901059901-110.1063/5.0070460Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)]Zhao Guan0Zhen-Zheng Jiang1Bo-Bo Tian2Yi-Ping Zhu3Ping-Hua Xiang4Ni Zhong5Chun-Gang Duan6Jun-Hao Chu7Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, ChinaKey Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai 200241, Chinahttp://dx.doi.org/10.1063/5.0070460 |
| spellingShingle | Zhao Guan Zhen-Zheng Jiang Bo-Bo Tian Yi-Ping Zhu Ping-Hua Xiang Ni Zhong Chun-Gang Duan Jun-Hao Chu Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)] AIP Advances |
| title | Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)] |
| title_full | Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)] |
| title_fullStr | Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)] |
| title_full_unstemmed | Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)] |
| title_short | Erratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)] |
| title_sort | erratum identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy aip adv 7 095116 2017 |
| url | http://dx.doi.org/10.1063/5.0070460 |
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