Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review

While Moore’s law scaling continues to double transistor density every technology generation, new design challenges are introduced. One of these challenges is variation, resulting in deviations in the behavior of transistors, most importantly in switching delays. These exaggerated delays widen the g...

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Bibliographic Details
Main Authors: Joseph Crop, Evgeni Krimer, Nariman Moezzi-Madani, Robert Pawlowski, Thomas Ruggeri, Patrick Chiang, Mattan Erez
Format: Article
Language:English
Published: MDPI AG 2011-10-01
Series:Journal of Low Power Electronics and Applications
Subjects:
Online Access:http://www.mdpi.com/2079-9268/1/3/334/