Non-Profiled Side-Channel Attack Based on Deep Learning Using Picture Trace

Over the years, deep learning algorithms have advanced a lot and any innovation in the algorithms are demonstrated and benchmarked for image classification. Several other field including side-channel analysis (SCA) have recently adopted deep learning with great success. In SCA, the deep learning alg...

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Bibliographic Details
Main Authors: Yoo-Seung Won, Dong-Guk Han, Dirmanto Jap, Shivam Bhasin, Jong-Yeon Park
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9343317/