Fractal grid-induced turbulence strength characterization via piezoelectric thin-film flapping velocimetry

Fractal grid-induced turbulence strength characterization via piezoelectric thin-film flapping velocimetry

Abstract The centerline streamwise and cross-sectional (x/D h  = 0.425) turbulence characteristics of a 2D planar space-filling square-fractal-grid (SFG) composed of self-similar patterns superimposed at multiple length-scales is experimentally unveiled via piezoelectric thin-film flapping velocimet...

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Bibliographic Details
Main Authors: Ted Sian Lee, Ean Hin Ooi, Wei Sea Chang, Ji Jinn Foo
Format: Article
Language:English
Published: Nature Portfolio 2021-12-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-02680-7

Internet

https://doi.org/10.1038/s41598-021-02680-7

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