Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM

The maneuvering and electrical characterization of nanotubes inside a scanning electron microscope (SEM) has historically been time-consuming and laborious for operators. Before the development of automated nanomanipulation-enabled techniques for the performance of pick-and-place and characterizatio...

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Bibliographic Details
Main Authors: Huiyang Ding, Chaoyang Shi, Li Ma, Zhan Yang, Mingyu Wang, Yaqiong Wang, Tao Chen, Lining Sun, Fukuda Toshio
Format: Article
Language:English
Published: MDPI AG 2018-04-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/18/4/1137