Hydrogen storage characteristics of Ti– and V–based thin films
Series of thin films of single-, bi- and tri-layered structure consisting of Ti, V, TiO2 and V2O5 layer and/or mixed Ti–V–Ni layer with different layer sequences and thicknesses were prepared by the sputtering technique on Si and SiO2 substrates. The layer chemical composition and thickness were det...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2016-06-01
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| Series: | Journal of Science: Advanced Materials and Devices |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468217916300284 |