Compact Single-Shot Dual-Wavelength Interferometry for Large Object Measurement with Rough Surfaces

Compact Single-Shot Dual-Wavelength Interferometry for Large Object Measurement with Rough Surfaces

Single-shot dual-wavelength interferometry offers a promising avenue for surface profile measurement of dynamic objects. However, current techniques employing pixel multiplexing or color cameras encounter challenges such as complex optical alignment, limited measurement range, and difficulty in meas...

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Bibliographic Details
Main Authors: Yizhang Yan, Suhas P. Veetil, Pengfei Zhu, Feng Gao, Yan Kong, Xiaoliang He, Aihui Sun, Zhilong Jiang, Cheng Liu
Format: Article
Language:English
Published: MDPI AG 2024-05-01
Series:Photonics
Subjects:
dual-wavelength interferometry
surface profile measurement
single shot
polarization camera
Online Access:https://www.mdpi.com/2304-6732/11/6/518

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https://www.mdpi.com/2304-6732/11/6/518

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