Enhanced Piezoelectricity by Polarization Rotation through Thermal Strain Manipulation in PbZr0.6Ti0.4O3 Thin Films

Enhanced Piezoelectricity by Polarization Rotation through Thermal Strain Manipulation in PbZr0.6Ti0.4O3 Thin Films

Abstract Lead based bulk piezoelectric materials, e.g., PbZrxTi1‐xO3 (PZT), are widely used in electromechanical applications, sensors, and transducers, for which optimally performing thin films are needed. The results of a multi‐domain Landau–Ginzberg‐Devonshire model applicable to clamped ferroele...

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Bibliographic Details
Main Authors: Sizhao Huang, Evert Houwman, Nicolas Gauquelin, Andrey Orekhov, Dmitry Chezganov, Johan Verbeeck, Sixia Hu, Gaokuo Zhong, Gertjan Koster, Guus Rijnders
Format: Article
Language:English
Published: Wiley-VCH 2024-07-01
Series:Advanced Materials Interfaces
Subjects:
phase
piezoelectric
PLD
PZT
strain
Online Access:https://doi.org/10.1002/admi.202400048

Internet

https://doi.org/10.1002/admi.202400048

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