Path Loss Modeling of RFID Backscatter Channels With Reconfigurable Intelligent Surface: Experimental Validation

Path Loss Modeling of RFID Backscatter Channels With Reconfigurable Intelligent Surface: Experimental Validation

In the realm of radio frequency identification (RFID) technology, the integration of reconfigurable intelligent surfaces (RISs) has opened up new possibilities for real-time remote data capturing and seamless connectivity. By manipulating the electromagnetic properties of the environment, RIS enable...

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Bibliographic Details
Main Authors: Mohammed El-Absi, Ali Alhaj Abbas, Deeb Tubail, Furkan Ilgac, Ashraf Abuelhaija, Yamen Zantah, Salama Ikki, Aydin Sezgin, Thomas Kaiser
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Path loss models
chipless RFID
RIS
experimental measurements
Online Access:https://ieeexplore.ieee.org/document/10258157/

Internet

https://ieeexplore.ieee.org/document/10258157/

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