Genetic Mapping of Quantitative Trait Loci Associated with Plant Height and Yield Component Traits in a Wheat (<i>Triticum aestivum</i> L.) Doubled Haploid Population Derived from Tugela-DN × Elands

Genetic Mapping of Quantitative Trait Loci Associated with Plant Height and Yield Component Traits in a Wheat (<i>Triticum aestivum</i> L.) Doubled Haploid Population Derived from Tugela-DN × Elands

Grain yield is a quantitatively inherited complex trait that is strongly influenced by interacting genetic and environmental factors. The identification of major quantitative trait loci (QTL) for plant height (PH) and yield component traits (YCT) is important for improving yield potential through wh...

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Bibliographic Details
Main Authors: Mantshiuwa Christinah Lephuthing, Thobeka Philile Khumalo, Vicki Louise Tolmay, Ernest Dube, Toi John Tsilo
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Agronomy
Subjects:
genotype-by-sequencing
plant height
quantitative trait loci
yield component traits
yield potential improvement
Online Access:https://www.mdpi.com/2073-4395/12/10/2283

Internet

https://www.mdpi.com/2073-4395/12/10/2283

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