Silicon Wafer CMP Slurry Using a Hydrolysis Reaction Accelerator with an Amine Functional Group Remarkably Enhances Polishing Rate
Recently, as an alternative solution for overcoming the scaling-down limitations of logic devices with design length of less than 3 nm and enhancing DRAM operation performance, 3D heterogeneous packaging technology has been intensively researched, essentially requiring Si wafer polishing at a very h...
Main Authors: | Jae-Young Bae, Man-Hyup Han, Seung-Jae Lee, Eun-Seong Kim, Kyungsik Lee, Gon-sub Lee, Jin-Hyung Park, Jea-Gun Park |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-11-01
|
Series: | Nanomaterials |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-4991/12/21/3893 |
Similar Items
-
Kajian Level Kadar Air dan Ukuran Partikel Bahan Pakan Terhadap Penampilan Fisik Wafer
by: Retno Iswarin Pujaningsih, et al.
Published: (2013-04-01) -
EFFECT OF GEOMETRY UPON COOLING CHARACTERISTICS OF WAFER BLOCK COOLERS
by: Mesut Bitkin, et al.
Published: (2023-03-01) -
Yield enhancement system for wafer fabrication /
by: 452918 Chan, Shen Yi
Published: (2002) -
Effect of Silicon Wafer Surface Stains on Copper-Assisted Chemical Etching
by: Liang Ma, et al.
Published: (2023-04-01) -
Wafer Center Alignment System of Transfer Robot Based on Reduced Number of Sensors
by: Hyungjong Kim
Published: (2022-11-01)