Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment
In nano-scale CMOS technology, circuit reliability is a growing concern for complicated digital circuits due to manufacturing process variation and aging effects. In this paper, a statistical circuit optimization framework is presented to analyze and improve the lifetime reliability of digital circu...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9509021/ |