Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement
Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact...
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| Format: | Article |
| Language: | English |
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Elsevier
2021-04-01
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| Series: | Nuclear Engineering and Technology |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S1738573320308809 |
| _version_ | 1818946655945228288 |
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| author | Junghwan Park Yong Suk Choi Junhyuck Kim Jeongmook Lee Tae Jun Kim Young-Sang Youn Sang Ho Lim Jong-Yun Kim |
| author_facet | Junghwan Park Yong Suk Choi Junhyuck Kim Jeongmook Lee Tae Jun Kim Young-Sang Youn Sang Ho Lim Jong-Yun Kim |
| author_sort | Junghwan Park |
| collection | DOAJ |
| description | Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R2 = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0–0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1–5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments. |
| first_indexed | 2024-12-20T08:18:28Z |
| format | Article |
| id | doaj.art-ecde019fd94145ac8892ab07144f8e3a |
| institution | Directory Open Access Journal |
| issn | 1738-5733 |
| language | English |
| last_indexed | 2024-12-20T08:18:28Z |
| publishDate | 2021-04-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Nuclear Engineering and Technology |
| spelling | doaj.art-ecde019fd94145ac8892ab07144f8e3a2022-12-21T19:47:04ZengElsevierNuclear Engineering and Technology1738-57332021-04-0153412971303Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurementJunghwan Park0Yong Suk Choi1Junhyuck Kim2Jeongmook Lee3Tae Jun Kim4Young-Sang Youn5Sang Ho Lim6Jong-Yun Kim7Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea; Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of KoreaNuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of KoreaNuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea; Corresponding author. Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea.Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of KoreaNuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of KoreaDepartment of Chemistry, Yeungnam University, Daehak-ro 280, Gyeongsan, Gyeongbuk, 38541, Republic of KoreaNuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea; Radiochemistry & Nuclear Nonproliferation, University of Science & Technology, Gajeong-ro 217, Yuseong-gu, Daejeon, 34113, Republic of Korea; Corresponding author. Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea.Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea; Radiochemistry & Nuclear Nonproliferation, University of Science & Technology, Gajeong-ro 217, Yuseong-gu, Daejeon, 34113, Republic of Korea; Corresponding author. Nuclear Chemistry Research Team, Korea Atomic Energy Research Institute, 111, Daedeok-daero 989beon-gil, Yuseong-gu, Daejeon, 34057, Republic of Korea.Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R2 = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0–0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1–5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments.http://www.sciencedirect.com/science/article/pii/S1738573320308809Organic filmX-ray fluorescenceCompton scatteringX-ray radiationThickness |
| spellingShingle | Junghwan Park Yong Suk Choi Junhyuck Kim Jeongmook Lee Tae Jun Kim Young-Sang Youn Sang Ho Lim Jong-Yun Kim Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement Nuclear Engineering and Technology Organic film X-ray fluorescence Compton scattering X-ray radiation Thickness |
| title | Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement |
| title_full | Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement |
| title_fullStr | Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement |
| title_full_unstemmed | Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement |
| title_short | Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement |
| title_sort | calibration free real time organic film thickness monitoring technique by reflected x ray fluorescence and compton scattering measurement |
| topic | Organic film X-ray fluorescence Compton scattering X-ray radiation Thickness |
| url | http://www.sciencedirect.com/science/article/pii/S1738573320308809 |
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