Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the <i>PPD-D1</i> Gene Responsible for Heading Delay and Grain Number Improvement

Development and Characterization of Near-Isogenic Lines Derived from Synthetic Wheat Revealing the 2 kb Insertion in the <i>PPD-D1</i> Gene Responsible for Heading Delay and Grain Number Improvement

Spikelet number and grain number per spike are two crucial and correlated traits for grain yield in wheat. <i>Photoperiod-1 (Ppd-1</i>) is a key regulator of inflorescence architecture and spikelet formation in wheat. In this study, near-isogenic lines derived from the cross of a synthet...

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Bibliographic Details
Main Authors: Shunzong Ning, Shengke Li, Kai Xu, Dongmei Liu, Li Ma, Chunfang Ma, Ming Hao, Lianquan Zhang, Wenjie Chen, Bo Zhang, Yun Jiang, Lin Huang, Xuejiao Chen, Bo Jiang, Zhongwei Yuan, Dengcai Liu
Format: Article
Language:English
Published: MDPI AG 2023-06-01
Series:International Journal of Molecular Sciences
Subjects:
synthetic wheat
<i>photoperiod-1</i>
number of days to heading
grain number per spike
spike length
spikelet number per spike
Online Access:https://www.mdpi.com/1422-0067/24/13/10834

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https://www.mdpi.com/1422-0067/24/13/10834

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