Polarization Sensitivity in Scattering-Type Scanning Near-Field Optical Microscopy—Towards Nanoellipsometry

Polarization Sensitivity in Scattering-Type Scanning Near-Field Optical Microscopy—Towards Nanoellipsometry

Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale and even below. Nevertheless, the out-of-plane electric field component is primarily considered here due to the l...

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Bibliographic Details
Main Authors: Felix G. Kaps, Susanne C. Kehr, Lukas M. Eng
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Series:Applied Sciences
Subjects:
nanooptics
materials science
nanotechnology
nanoellipsometry
s-polarization
p-polarization
Online Access:https://www.mdpi.com/2076-3417/13/18/10429

Internet

https://www.mdpi.com/2076-3417/13/18/10429

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