Proton irradiation impact on interface traps under Schottky contact in AlGaN/GaN heterostructure
The effect of 3 MeV proton irradiation on interface traps under a Schottky contact in an AlGaN/GaN heterostructure has been investigated in this work. Utilizing the frequency-dependent conductance technique, the detailed information about interface traps under different proton doses has been evaluat...
Main Authors: | , , , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2020-06-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/5.0007650 |