Sensitivity Analysis of Shielded Coupled Interconnects for RFIC Applications
In this paper the sensitivity of on-chip interconnects to Si CMOS process parameters in two different test structures are reported; two coupled lines with shielding, and without shielding. Simulations are performed using HSpiceRF to emulate the state-of-the-art and the future technologies for the te...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Iran Telecom Research Center
2011-12-01
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| Series: | International Journal of Information and Communication Technology Research |
| Subjects: | |
| Online Access: | http://ijict.itrc.ac.ir/article-1-202-en.html |