Characterization of Structural Defects in (Cd,Zn)Te Crystals Grown by the Travelling Heater Method

Characterization of Structural Defects in (Cd,Zn)Te Crystals Grown by the Travelling Heater Method

Structural defects and compositional uniformity remain the major problems affecting the performance of (Cd, Zn)Te (CZT) based detector devices. Understanding the mechanism of growth and defect formation is therefore fundamental to improving the crystal quality. In this frame, space experiments for t...

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Bibliographic Details
Main Authors: Jiaona Zou, Alex Fauler, Alexander S. Senchenkov, Nikolai N. Kolesnikov, Lutz Kirste, Merve Pinar. Kabukcuoglu, Elias Hamann, Angelica Cecilia, Michael Fiederle
Format: Article
Language:English
Published: MDPI AG 2021-11-01
Series:Crystals
Subjects:
CZT
THM
structural defects
homogeneity
resistivity
birefringence
Online Access:https://www.mdpi.com/2073-4352/11/11/1402

Internet

https://www.mdpi.com/2073-4352/11/11/1402

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