On the Usage of Tapered Undulators in the Measurement of Interference in the Intensity-Dependent Electron Mass Shift

On the Usage of Tapered Undulators in the Measurement of Interference in the Intensity-Dependent Electron Mass Shift

In nonlinear Thomson scattering, the main emission line and its harmonics form a band-like structure due to the laser pulse shape induced ponderomotive broadening. We propose to use tapered undulators to mimic Thomson scattering and measure the intensity-dependent electron mass shift experimentally....

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Bibliographic Details
Main Authors: Maksim A. Valialshchikov, Marcel Ruijter, Sergey G. Rykovanov
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Crystals
Subjects:
Thomson scattering
Compton scattering
synchrotron radiation
undulator radiation
Online Access:https://www.mdpi.com/2073-4352/11/5/486

Internet

https://www.mdpi.com/2073-4352/11/5/486

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