Synthesizing Industrial Defect Images Under Data Imbalance

Defect detection is a crucial technology in the industry that enhances production efficiency within the manufacturing sector. However, obtaining a balanced dataset with sufficient samples of both normal and defect is often challenging and time-consuming. Constructing an unbalanced dataset skewed tow...

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Bibliographic Details
Main Authors: Eunhee Cho, Byeonghwan Jeon, In Kyu Park
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10274069/