Connection between micron-sized defects and dielectric strength of poly(dimethylsiloxane) elastomer films

Connection between micron-sized defects and dielectric strength of poly(dimethylsiloxane) elastomer films

The quality of dielectric elastomer (DE) films is a key factor affecting the reliability of DE actuators. Reported here is the effect of the number of micron-sized defects on dielectric strength (DS) for poly(dimethylsiloxane) (PDMS) DE films. Using the same PDMS formulation but different procedures...

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Bibliographic Details
Main Authors: Hiroshi Fukui, Takeaki Tsuda, Yoichi Kaminaga, Yoonyoung Kim
Format: Article
Language:English
Published: Elsevier 2022-07-01
Series:Polymer Testing
Subjects:
Poly(dimethylsiloxane)
Dielectric elastomer
Dielectric strength
Thin film
Micron-sized defect
Weibull analysis
Online Access:http://www.sciencedirect.com/science/article/pii/S0142941822001210

Internet

http://www.sciencedirect.com/science/article/pii/S0142941822001210

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