Connection between micron-sized defects and dielectric strength of poly(dimethylsiloxane) elastomer films
The quality of dielectric elastomer (DE) films is a key factor affecting the reliability of DE actuators. Reported here is the effect of the number of micron-sized defects on dielectric strength (DS) for poly(dimethylsiloxane) (PDMS) DE films. Using the same PDMS formulation but different procedures...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-07-01
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| Series: | Polymer Testing |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0142941822001210 |