In-situ characterization of the semiconductor-metal phase transition in vanadium dioxide thin films
Vanadium dioxide (VO2) exhibits a reversible first-order semiconductor-metal phase transition (SMT) near 68 °C at ambient pressure, consisting in a structural transformation from a low-temperature semiconducting monoclinic phase to a high-temperature metallic rutile phase. This phenomenon is investi...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2024-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2024/19/epjconf_eosam2024_06010.pdf |