On the Aging of OTFTs and Its Impact on PUFs Reliability

Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to...

Full description

Bibliographic Details
Main Authors: Marc Porti, Gerard Palau, Albert Crespo-Yepes, August Arnal Rus, Simon Ogier, Eloi Ramon, Montserrat Nafria
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/15/4/443