Evaluation of the Dispersion Stability of AZO Mesocrystals for Their Processing into Functional Thin Films Using Small Angle X-ray Scattering

Evaluation of the Dispersion Stability of AZO Mesocrystals for Their Processing into Functional Thin Films Using Small Angle X-ray Scattering

Within the scope of the comprehensive elucidation of the entire process chain for the production of highly functional thin films made of semiconducting aluminum-doped zinc oxide (<inline-formula> <math display="inline"> <semantics> <mrow> <mi>A</mi> <...

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Bibliographic Details
Main Authors: Julian Ungerer, Ann-Kathrin Thurm, Georg Garnweitner, Hermann Nirschl
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Crystals
Subjects:
aluminum-doped zinc oxide
mesocrystals
non-invasive SAXS analysis
dispersion stability criteria
particle morphology
transparent conductive oxide
Online Access:https://www.mdpi.com/2073-4352/10/5/374

Internet

https://www.mdpi.com/2073-4352/10/5/374

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