Wide-range evaluation of the deposition layer thickness distribution on the first wall by reflection coefficient measurements
A simple method to evaluate the thickness distribution of the deposition layer formed on the first wall is proposed using an innovative measurement concept of the optical reflection coefficient, which is measured as the RGB (red, green, blue) value using a compact color analyzer. Analysis of the sam...
| Main Authors: | , , , , , , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2017-08-01
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| Series: | Nuclear Materials and Energy |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352179116300928 |