Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method
A study of the random telegraph noise (RTN) of a 1.1 μm pitch, 8.3 Mpixel CMOS image sensor (CIS) fabricated in a 45 nm backside-illumination (BSI) technology is presented in this paper. A noise decomposition scheme is used to pinpoint the noise source. The long tail of the random noise (RN) distrib...
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MDPI AG
2017-11-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/17/12/2704 |
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| author | Calvin Yi-Ping Chao Honyih Tu Thomas Meng-Hsiu Wu Kuo-Yu Chou Shang-Fu Yeh Chin Yin Chih-Lin Lee |
| author_facet | Calvin Yi-Ping Chao Honyih Tu Thomas Meng-Hsiu Wu Kuo-Yu Chou Shang-Fu Yeh Chin Yin Chih-Lin Lee |
| author_sort | Calvin Yi-Ping Chao |
| collection | DOAJ |
| description | A study of the random telegraph noise (RTN) of a 1.1 μm pitch, 8.3 Mpixel CMOS image sensor (CIS) fabricated in a 45 nm backside-illumination (BSI) technology is presented in this paper. A noise decomposition scheme is used to pinpoint the noise source. The long tail of the random noise (RN) distribution is directly linked to the RTN from the pixel source follower (SF). The full 8.3 Mpixels are classified into four categories according to the observed RTN histogram peaks. A theoretical formula describing the RTN as a function of the time difference between the two phases of the correlated double sampling (CDS) is derived and validated by measured data. An on-chip time constant extraction method is developed and applied to the RTN analysis. The effects of readout circuit bandwidth on the settling ratios of the RTN histograms are investigated and successfully accounted for in a simulation using a RTN behavior model. |
| first_indexed | 2024-04-11T13:40:19Z |
| format | Article |
| id | doaj.art-f461e8f2a1734245af506233cf4b56c6 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-04-11T13:40:19Z |
| publishDate | 2017-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-f461e8f2a1734245af506233cf4b56c62022-12-22T04:21:16ZengMDPI AGSensors1424-82202017-11-011712270410.3390/s17122704s17122704Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction MethodCalvin Yi-Ping Chao0Honyih Tu1Thomas Meng-Hsiu Wu2Kuo-Yu Chou3Shang-Fu Yeh4Chin Yin5Chih-Lin Lee6Taiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanTaiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanTaiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanTaiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanTaiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanTaiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanTaiwan Semiconductor Manufacturing Company, Hsinchu Science Park, Hsinchu 300, TaiwanA study of the random telegraph noise (RTN) of a 1.1 μm pitch, 8.3 Mpixel CMOS image sensor (CIS) fabricated in a 45 nm backside-illumination (BSI) technology is presented in this paper. A noise decomposition scheme is used to pinpoint the noise source. The long tail of the random noise (RN) distribution is directly linked to the RTN from the pixel source follower (SF). The full 8.3 Mpixels are classified into four categories according to the observed RTN histogram peaks. A theoretical formula describing the RTN as a function of the time difference between the two phases of the correlated double sampling (CDS) is derived and validated by measured data. An on-chip time constant extraction method is developed and applied to the RTN analysis. The effects of readout circuit bandwidth on the settling ratios of the RTN histograms are investigated and successfully accounted for in a simulation using a RTN behavior model.https://www.mdpi.com/1424-8220/17/12/2704CMOS image sensor (CIS)random telegraph noise (RTN)correlated double sampling (CDS)RTN emission and capture time constantbackside-illuminated technology (BSI)pinned photodiode (PPD)Gumbel distribution |
| spellingShingle | Calvin Yi-Ping Chao Honyih Tu Thomas Meng-Hsiu Wu Kuo-Yu Chou Shang-Fu Yeh Chin Yin Chih-Lin Lee Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method Sensors CMOS image sensor (CIS) random telegraph noise (RTN) correlated double sampling (CDS) RTN emission and capture time constant backside-illuminated technology (BSI) pinned photodiode (PPD) Gumbel distribution |
| title | Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method |
| title_full | Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method |
| title_fullStr | Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method |
| title_full_unstemmed | Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method |
| title_short | Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method |
| title_sort | statistical analysis of the random telegraph noise in a 1 1 μm pixel 8 3 mp cmos image sensor using on chip time constant extraction method |
| topic | CMOS image sensor (CIS) random telegraph noise (RTN) correlated double sampling (CDS) RTN emission and capture time constant backside-illuminated technology (BSI) pinned photodiode (PPD) Gumbel distribution |
| url | https://www.mdpi.com/1424-8220/17/12/2704 |
| work_keys_str_mv | AT calvinyipingchao statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod AT honyihtu statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod AT thomasmenghsiuwu statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod AT kuoyuchou statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod AT shangfuyeh statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod AT chinyin statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod AT chihlinlee statisticalanalysisoftherandomtelegraphnoiseina11mmpixel83mpcmosimagesensorusingonchiptimeconstantextractionmethod |