A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources

A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources

Abstract The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-...

Full description

Bibliographic Details
Main Authors: Nazanin Samadi, Xianbo Shi, Cigdem Ozkan Loch, Juraj Krempasky, Michael Boege, Dean Chapman, Marco Stampanoni
Format: Article
Language:English
Published: Nature Portfolio 2022-10-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-022-23004-3

Internet

https://doi.org/10.1038/s41598-022-23004-3

Similar Items