A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources
Abstract The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2022-10-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-022-23004-3 |
| _version_ | 1828731784647409664 |
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| author | Nazanin Samadi Xianbo Shi Cigdem Ozkan Loch Juraj Krempasky Michael Boege Dean Chapman Marco Stampanoni |
| author_facet | Nazanin Samadi Xianbo Shi Cigdem Ozkan Loch Juraj Krempasky Michael Boege Dean Chapman Marco Stampanoni |
| author_sort | Nazanin Samadi |
| collection | DOAJ |
| description | Abstract The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-crystal diffraction geometry, including a crystal-based monochromator and a Laue crystal in a dispersive setting to the monochromator. By measuring the flat beam and the transmitted beam profiles, the system can provide a simultaneous high-sensitivity characterization of the source size, divergence, position, and angle in the diffraction plane of the multi-crystal system. Detailed theoretical modeling predicts the system’s feasibility as a versatile characterization tool for monitoring the X-ray source and beam properties. The experimental validation was conducted at a bending magnet beamline at the Swiss Light Source by varying the machine parameters. A measurement sensitivity of less than 10% of a source size of around 12 µm is demonstrated. The proposed system offers a compact setup with simple X-ray optics and can also be utilized for monitoring the electron source. |
| first_indexed | 2024-04-12T17:51:23Z |
| format | Article |
| id | doaj.art-f4c5c8b08e0e469d8a09097c110fc871 |
| institution | Directory Open Access Journal |
| issn | 2045-2322 |
| language | English |
| last_indexed | 2024-04-12T17:51:23Z |
| publishDate | 2022-10-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj.art-f4c5c8b08e0e469d8a09097c110fc8712022-12-22T03:22:30ZengNature PortfolioScientific Reports2045-23222022-10-011211910.1038/s41598-022-23004-3A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sourcesNazanin Samadi0Xianbo Shi1Cigdem Ozkan Loch2Juraj Krempasky3Michael Boege4Dean Chapman5Marco Stampanoni6Paul Scherrer Institute (PSI)Advanced Photon Source, Argonne National LaboratoryPaul Scherrer Institute (PSI)Paul Scherrer Institute (PSI)Paul Scherrer Institute (PSI)Anatomy, Physiology and Pharmacology, University of SaskatchewanPaul Scherrer Institute (PSI)Abstract The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-crystal diffraction geometry, including a crystal-based monochromator and a Laue crystal in a dispersive setting to the monochromator. By measuring the flat beam and the transmitted beam profiles, the system can provide a simultaneous high-sensitivity characterization of the source size, divergence, position, and angle in the diffraction plane of the multi-crystal system. Detailed theoretical modeling predicts the system’s feasibility as a versatile characterization tool for monitoring the X-ray source and beam properties. The experimental validation was conducted at a bending magnet beamline at the Swiss Light Source by varying the machine parameters. A measurement sensitivity of less than 10% of a source size of around 12 µm is demonstrated. The proposed system offers a compact setup with simple X-ray optics and can also be utilized for monitoring the electron source.https://doi.org/10.1038/s41598-022-23004-3 |
| spellingShingle | Nazanin Samadi Xianbo Shi Cigdem Ozkan Loch Juraj Krempasky Michael Boege Dean Chapman Marco Stampanoni A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources Scientific Reports |
| title | A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources |
| title_full | A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources |
| title_fullStr | A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources |
| title_full_unstemmed | A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources |
| title_short | A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources |
| title_sort | spatial beam property analyzer based on dispersive crystal diffraction for low emittance x ray light sources |
| url | https://doi.org/10.1038/s41598-022-23004-3 |
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