A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources
Abstract The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-...
Main Authors: | Nazanin Samadi, Xianbo Shi, Cigdem Ozkan Loch, Juraj Krempasky, Michael Boege, Dean Chapman, Marco Stampanoni |
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Format: | Article |
Language: | English |
Published: |
Nature Portfolio
2022-10-01
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Series: | Scientific Reports |
Online Access: | https://doi.org/10.1038/s41598-022-23004-3 |
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