Validating S‐parameter measurements of RF integrated circuits at milli‐Kelvin temperatures
Abstract Techniques to precisely characterise RF components at milli‐Kelvin temperatures support the development of quantum computing systems utilising these components. In this work, an S‐parameter measurement setup to characterise RF integrated circuits at milli‐Kelvin temperatures has been propos...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2022-08-01
|
| Series: | Electronics Letters |
| Online Access: | https://doi.org/10.1049/ell2.12545 |