Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy

Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy

High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiOx and TaOx at the HIP inter...

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Bibliographic Details
Main Authors: Hiroshi Sakurai, Kosuke Suzuki, Shoya Ishii, Kazushi Hoshi, Takashi Nozawa, Hidetsugu Ozaki, Hiroto Haga, Hiroyasu Tanigawa, Yoji Someya, Masao Tsuchiya, Hiroshi Takeuchi, Naruki Tsuji
Format: Article
Language:English
Published: Elsevier 2022-06-01
Series:Nuclear Materials and Energy
Subjects:
F82H steel
HIP interface
Compton scattering
High energy X-rays
NDT
Online Access:http://www.sciencedirect.com/science/article/pii/S2352179122000576

Internet

http://www.sciencedirect.com/science/article/pii/S2352179122000576

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