TFT-LCD Mura Defects Using Independent Component Analysis
Independent component analysis (ICA) is used to detect the mura regions with varying sizes and brightness levels before thresholding, then individually analyzed the mura regions in order to avoid unnecessary background effect. Defects detection is performed by partitioning test image into overlappin...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
The Japan Society of Mechanical Engineers
2009-05-01
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| Series: | Journal of Advanced Mechanical Design, Systems, and Manufacturing |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/jamdsm/3/1/3_1_115/_pdf/-char/en |