Ray Tracing Simulation of X-ray Microdiffraction Beamline on the Inverse Compton Source

Ray Tracing Simulation of X-ray Microdiffraction Beamline on the Inverse Compton Source

This paper deals with the simulation of output beam parameters of the inverse Compton X-ray Source (ICS). The simulation takes into account the main parameters of the laser and electron beams, such as their pulse shapes, polarization properties as well as the angular and energy dispersion of the ele...

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Bibliographic Details
Main Authors: Alexander Vinogradov, Ruslan Feshchenko, Vasiliy Shvedunov, Igor Artyukov
Format: Article
Language:English
Published: MDPI AG 2023-05-01
Series:Symmetry
Subjects:
Thomson scattering
ICS
X-ray optics
Laue diffraction
ray tracing
Online Access:https://www.mdpi.com/2073-8994/15/5/1068

Internet

https://www.mdpi.com/2073-8994/15/5/1068

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