Topology, Design, and Characteristics of a Modular, Dynamic 100 kA Surge Current Source With Adjustable Current Shape

Topology, Design, and Characteristics of a Modular, Dynamic 100 kA Surge Current Source With Adjustable Current Shape

To guarantee sufficient surge current fault protection for power electronic converters, power semiconductors have to be tested under appropriate surge current conditions. Standard maximum surge current values include the permissible fault current amplitude, or the <italic>I</italic><s...

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Bibliographic Details
Main Authors: Stefan Wettengel, Andreas Hoffmann, Jonas Kienast, Lars Lindenmuller, Steffen Bernet
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Open Journal of Industry Applications
Subjects:
Circuit testing
power electronics
pulse power systems
power semiconductor devices
power semiconductor switches
semiconductor device testing
Online Access:https://ieeexplore.ieee.org/document/10398419/

Internet

https://ieeexplore.ieee.org/document/10398419/

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