Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors

Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors

Imaging performance metrics of single-bit and multi-bit photo-electron-counting quanta image sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. The D-log H characteristic of single-bit sensors including overexposure latitude is qua...

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Bibliographic Details
Main Author: Eric R. Fossum
Format: Article
Language:English
Published: IEEE 2013-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Active pixel sensor
APS
binary pixel
CIS
CMOS image sensor
low noise
Online Access:https://ieeexplore.ieee.org/document/6615911/

Internet

https://ieeexplore.ieee.org/document/6615911/

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