Influence of Quality of Mounting Process of RF Transistors on Their Thermal Parameters and Lifetime

Influence of Quality of Mounting Process of RF Transistors on Their Thermal Parameters and Lifetime

The paper presents the results of investigations illustrating the influence of imperfections in the soldering process on thermal properties of transistors operating in RF (Radio Frequency) systems. The methods of measurements used to determine the junction and case temperature of the tested transist...

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Bibliographic Details
Main Authors: Krzysztof Górecki, Wojciech Kowalke, Przemysław Ptak
Format: Article
Language:English
Published: MDPI AG 2022-06-01
Series:Applied Sciences
Subjects:
RF networks
assembly process
thermal parameters
measurements
lifetime
Online Access:https://www.mdpi.com/2076-3417/12/12/6113

Internet

https://www.mdpi.com/2076-3417/12/12/6113

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