Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress

Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress

The reliable operation of an integrated circuit can be affected by environmental changes, such as of multiple frequency electromagnetic (EM) disturbances and temperature variations. This paper compares the performance of two oscillator circuits, namely a current-starved voltage controlled oscillator...

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Bibliographic Details
Main Authors: Qazi Mashaal Khan, Lokesh Devaraj, Richard Perdriau, Alastair R. Ruddle, Tim Claeys, Mohamed Ramdani, Mohsen Koohestani
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
Integrated circuit (IC)
multitone EM disturbance
Bayesian network (BN)
synergistic effect
temperature deviation
noisy-OR
Online Access:https://ieeexplore.ieee.org/document/9852461/

Internet

https://ieeexplore.ieee.org/document/9852461/

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